Discussion on “Assessing the goodness of fit of logistic regression models in large samples: A modification of the Hosmer-Lemeshow test” by Giovanni Nattino, Michael L. Pennell, and Stanley Lemeshow

註解

Biometrics

2020

摘要

Statistics and Probability

Biochemistry

Genetics and Molecular Biology (all)

Immunology and Microbiology (all)

Agricultural and Biological Sciences (all)

Applied Mathematics

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題名: Discussion on “Assessing the goodness of fit of logistic regression models in large samples: A modification of the Hosmer-Lemeshow test” by Giovanni Nattino, Michael L. Pennell, and Stanley Lemeshow
翻譯題名: Discussion on “Assessing the goodness of fit of logistic regression models in large samples: A modification of the Hosmer-Lemeshow test” by Giovanni Nattino, Michael L. Pennell, and Stanley Lemeshow
創作者：: Galit Shmueli (作者) - National Tsing Hua University
學術資源類型: 註解
出版日期: 2020
出版資訊: Biometrics
語言: 英語