Abstract
Skip-Lot Sampling Plans (SkSP) reduce inspection costs while maintaining quality in continuous production. The SkSP-2L.1 method, a two-level skip-lot sampling plan, enhances flexibility by using two inspection rates based on quality history. This paper integrates SkSP-2L.1 with the Process yield index, a key metric for process and product quality evaluation. Starting with normal inspection, SkSP-2L.1 transitions to higher skip levels upon consecutive acceptances, introducing a second, more relaxed inspection rate for consistently high quality. Using a Markov chain framework, we derive the operating characteristic function and average sample number for the integrated SkSP-2L.1 plan. Parameters are optimized by solving a minimization problem considering acceptable risks and quality levels. Results show our method significantly improves the efficiency and reliability of SkSP- 2L.1, offering a cost-effective solution for lot sentencing in high-quality production environments.