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A 1 MHz 4 ppm CMOS-MEMS oscillator with built-in self-test and sub-mW ovenization power
Conference paper

A 1 MHz 4 ppm CMOS-MEMS oscillator with built-in self-test and sub-mW ovenization power

Chun-You Liu, Ming-Huang Li, H.G. Ranjith and Sheng-Shian Li
Technical Digest - International Electron Devices Meeting, IEDM, pp.26.7.1-26.7.4
01/2017
Appears in  keyword about Physics

Abstract

CMOS integrated circuits;Electron devices;Oscillators;Ovens;Phase noise;Resonators;Temperature measuring instruments Electronic,Optical and Magnetic Materials,Condensed Matter Physics,Electrical and Electronic Engineering,Materials Chemistry
A 1 MHz 4 ppm temperature-stable micro-oven μOven) controlled monolithic CMOS-MEMS oscillator has been demonstrated in this work, exhibiting heating power in sub-mW across the 100°C temperature span. The proposed novel isothermal μOven platform consists of dual heaters, one of which stabilizes the resonator temperature while the other of which serves as built-in self-test (BIST) to mimic ambient temperature, and a resistive temperature detector (RTD) for local resonator temperature monitoring. By adapting the constant-resistance (CR) feedback temperature control scheme, the integrated 1 MHz CMOS-MEMS oscillator shows a maximum frequency inaccuracy of only 4 ppm during a fast temperature ramp across the 94°C testing span (i.e., < 43 ppb/°C). The oscillator circuit shows a worst-case bias instability of 60 ppb and phase noise (PN) of -105 dBc/Hz at 1-kHz offset (Q = 1,700).

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