- 題名
- A 22nm 104.5TOPS/W μ-NMC-Δ-IMC Heterogeneous STT-MRAM CIM Macro for Noise-Tolerant Bayesian Neural Networks
- 創作者：
- De Qi You - National Tsing Hua UniversityWin San Khwa - Taiwan Semiconductor Manufacturing Company (China)Bo Zhang - Taiwan Semiconductor Manufacturing Company (United States)Fang Yi Chen - National Tsing Hua University, Hsinchu, TaiwanAndrew Lee - National Tsing Hua UniversityYu Cheng Hung - National Tsing Hua UniversityYi Ming Li - National Tsing Hua UniversityYu Hui Wang - National Tsing Hua UniversityChung Chuan Lo - National Tsing Hua UniversityRen Shuo Liu - 國立清華大學, 半導體研究學院Kea Tiong Tang - 國立清華大學, 半導體研究學院Chih Cheng Hsieh - 國立清華大學, 半導體研究學院Yu Der Chih - Taiwan Semiconductor Manufacturing Company (Taiwan)Tsung Yung Jonathan Chang - Taiwan Semiconductor Manufacturing Company (Taiwan)Meng Fan Chang - National Tsing Hua University
- 會議
- 2025 IEEE International Solid-State Circuits Conference (ISSCC) (San Francisco, CA, USA, 16/02/2025–20/02/2025)
- 補助款備註
- NTHU-TSMC JDP Taiwan Semiconductor Research Institute, National Applied Research Laboratories (http://data.elsevier.com/vocabulary/SciValFunders/100031954) National Science and Technology Council (http://data.elsevier.com/vocabulary/SciValFunders/100020595)
- 學術資源類型
- 會議論文
- 出版日期
- 2025
- 出版資訊
- Digest of technical papers - IEEE International Solid-State Circuits Conference
- 語言
- 英語
會議論文
A 22nm 104.5TOPS/W μ-NMC-Δ-IMC Heterogeneous STT-MRAM CIM Macro for Noise-Tolerant Bayesian Neural Networks
Digest of technical papers - IEEE International Solid-State Circuits Conference
2025 IEEE International Solid-State Circuits Conference (ISSCC) (San Francisco, CA, USA, 16/02/2025–20/02/2025)
2025
指標
1 檢視次數