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A 2.3 μm2 memory cell structure for 16 Mb NAND EEPROMs
Conference paper

A 2.3 μm2 memory cell structure for 16 Mb NAND EEPROMs

R. Shirota, R. Nakayama, R. Kirisawa, M. Momodomi, K. Sakui, Y. Itoh, S. Aritome, T. Endoh, F. Hatori and F. Masuoka
Technical Digest - International Electron Devices Meeting, pp.103-106
12/1990
Appears in  keyword about Physics

Abstract

Electronic Optical and Magnetic Materials Condensed Matter Physics Electrical and Electronic Engineering Materials Chemistry
A NAND structure memory cell with 2.2 × 1.05 μm 2 size per bit, based on a 0.6 μm design rule, has been developed for 16 Mb flash EEPROMs. The cell size is about 64% of the smallest 16 Mb EPROM cell so far reported. An extremely small cell can be realized by the following technologies: (1) newly developed 0.3 μm space self-aligned stacked gate patterning, (2) a NAND structured cell array which contains 16 memory transistors in series, and (3) high-voltage field isolation technology used to isolate neighboring bits. The first and second technologies reduce the length of the cell by 67.6% compared with the conventional NAND structured cell using the same design rule, while the third technology reduces the width by 84.6%.

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