- Title
- A Built-in Self-Test Scheme for Detecting Defects in FinFET-Based SRAM Circuit
- Creators - without role
- M.-C. ChenT.-H. WuC.-W. Wu
- Publication Details
- Proc. 27th IEEE Asian Test Symp. (ATS)
- Identifiers
- 9957768134506774
- Academic Unit
- College of Electrical Engineering and Computer Science, National Tsing Hua University
- Language
- Traditional Chinese
- Resource Type
- Conference paper
Conference paper
A Built-in Self-Test Scheme for Detecting Defects in FinFET-Based SRAM Circuit
Proc. 27th IEEE Asian Test Symp. (ATS)
08/2018
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