A Deep Learning-Based Screening Method for Improving the Quality and Reliability of Integrated Passive Devices

Conference paper

Y.-C. Pan, Y.-R. Jian, H.-H. Liu and C.-W. Wu

Proc. VLSI Test Technology Workshop (VTTW)

07/2018

Abstract

Deep Learning-Based Screening Method;Reliability;Integrated Passive Devices

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Title: A Deep Learning-Based Screening Method for Improving the Quality and Reliability of Integrated Passive Devices
Creators - without role: Y.-C. Pan
Y.-R. Jian
H.-H. Liu
C.-W. Wu
Publication Details: Proc. VLSI Test Technology Workshop (VTTW)
Identifiers: 9957772051806774
Academic Unit: College of Electrical Engineering and Computer Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper