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A High Quality Dielectric Layer of EWOD Microfluidic Device Using LPCVD Si3N4
Conference paper

A High Quality Dielectric Layer of EWOD Microfluidic Device Using LPCVD Si3N4

Hsien-Hua Shen and Da-Jeng Yao
7th Annual IEEE International conference on Nano/Molecular Medicine and Engineering (IEEE-Nanomed 2013)
11/2013

Abstract

Dielectric Layer;EWOD;Microfluidic;LPCVD

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