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A Performance Study of Ge1-xSix on Ge-Based NMOSFETs by Using Device Simulation Combined with Higher Order Stress-Piezoresistive Relationships
Conference paper

A Performance Study of Ge1-xSix on Ge-Based NMOSFETs by Using Device Simulation Combined with Higher Order Stress-Piezoresistive Relationships

C. C. Lee, C. P. Hsieh, P. C. Huang, S. W. Cheng and M. H. Liao
9th International Conference on Silicon Epitaxy and Heterostructures (ICSI-9) 9th International Conference on Silicon Epitaxy and Heterostructures (ICSI-9)
2015

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