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A Probabilistic Approach of Fault Propagation at RTL and its Application to Transient Fault Analysis
會議論文

A Probabilistic Approach of Fault Propagation at RTL and its Application to Transient Fault Analysis

Chien-Hsing Liang, Yu-Hong Chao, Jing-Jia Liou 和 Harry Chen
Proceedings - International Test Conference, 頁碼.186-195
IEEE
2025 IEEE International Test Conference (ITC) (San Diego, CA, USA, 20/09/2025–26/09/2025)
20/09/2025

摘要

Accuracy Circuit faults Estimation Fault Injection Fault Propagation Fault Sampling Fault Simulation Integrated circuit reliability Probabilistic Estimation Probabilistic logic Register transfer level Registers Transient analysis Transient Fault Reliability Engineering
In this paper, we proposed a novel probabilistic fault propagation method for circuit of the register transfer level (RTL), enabling early-stage fault injection analysis. For the proposed method, we formulate and compute the probability of fault propagating to the output of an RTL operator based on the input logic patterns. By computing the probability of operators level by level (keeping correct circuit evaluation order), we can estimate the propagation probability at destination registers for each injected fault. By the probabilistic propagation list, we can then construct a propagation graph for multi-cycle analysis to avoid lengthy fault simulations.In our experiments, the proposed method can have a speedup of 35X to 158X faster than a traditional fault injection method, while achieving an average of 94.94% accuracy in the prediction of propagation of an injected fault. Hence, the proposed method can be applied to select high-quality fault candidates and to quickly evaluate the reliability of different design choices.

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