- Title
- A Similarity Ranking Approach to Reduce False Alarm of Defect Classification in CMOS Image Sensor Manufacturing
- Creators - without role
- Chu-Yuan FanKuo-Hao Chang - 國立清華大學工學院工業工程與工程管理學系Chen-Fu ChienYing-Jen
- Identifiers
- 9957773433406774
- Academic Unit
- Department of Industrial Engineering and Engineering Management, College of Engineering, National Tsing Hua University
- Language
- Traditional Chinese
- Resource Type
- Conference paper
- Publication Details
- Proceedings of 2014 International Symposium on Semiconductor Manufacturing Intelligence (ISMI2014) Proceedings of 2014 International Symposium on Semiconductor Manufacturing Intelligence (ISMI2014)
Conference paper
A Similarity Ranking Approach to Reduce False Alarm of Defect Classification in CMOS Image Sensor Manufacturing
Proceedings of 2014 International Symposium on Semiconductor Manufacturing Intelligence (ISMI2014) Proceedings of 2014 International Symposium on Semiconductor Manufacturing Intelligence (ISMI2014)
2014
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