A Thin-film Stress Measurement System for Barrier Films by Photoelasticity

Conference paper

W. Y. Yeh, M. H. Hsu, P. C. Sung, W. H. Liu, H. C. Kao, H. C. Chen and 偉中王

2019 International Conference on Flexible and Printed Electronics, 2019 ICFPE (10th ICFPE)

2019

Abstract

Barrier Films;Photoelasticity;Thin-film Stress

1 Record Views

Title: A Thin-film Stress Measurement System for Barrier Films by Photoelasticity
Creators - without role: W. Y. Yeh
M. H. Hsu
P. C. Sung
W. H. Liu
H. C. Kao
H. C. Chen
偉中王
Publication Details: 2019 International Conference on Flexible and Printed Electronics, 2019 ICFPE (10th ICFPE)
Identifiers: 9957769535406774
Academic Unit: Center for India Studies, Office of Academic Affairs, National Tsing Hua University
Language: English
Resource Type: Conference paper