A fast and sensitive built-in current sensor for IDDQ testing

Chih-Wen Lu; Chung Len Lee; Jwu-E Chen

doi:10.1109/IDDQ.1996.557816

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Conference paper

A fast and sensitive built-in current sensor for IDDQ testing

Chih-Wen Lu, Chung Len Lee and Jwu-E Chen

Digest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996, pp.56-58

1996

DOI: https://doi.org/10.1109/IDDQ.1996.557816

Abstract

Electrical and Electronic Engineering

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In this work, a fast and highly sensitive Built-in Current (BIC) sensor is proposed for testing static CMOS ICs. The sensor employs a current mirror and an I-V converter to achieve the high sensing speed and high resolution. The circuit is simple and occupies a small area, making it ideal to be integrated into the IC chip for the IDDQ application.

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Title: A fast and sensitive built-in current sensor for IDDQ testing
Translated title: A fast and sensitive built-in current sensor for IDDQ testing
Creators - without role: Chih-Wen Lu - Department of Electronic Engineering , National Chiao Tung University
Chung Len Lee - National Yang Ming Chiao Tung University
Jwu-E Chen - Chung Hua University
Publication Details: Digest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996, pp.56-58
Identifiers: 0818676558; 9780818676550; 9957769089106774
Academic Unit: Department of Engineering and System Science, College of Nuclear Science, National Tsing Hua University
Language: English
Resource Type: Conference paper

A fast and sensitive built-in current sensor for IDDQ testing

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