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A new lot sentencing method by variables inspection
Conference paper

A new lot sentencing method by variables inspection

Yen-Wen Chen and Chien-Wei Wu
Proceedings of the 2014 IEEE 18th International Conference on Computer Supported Cooperative Work in Design, CSCWD 2014, pp.380-383
2014

Abstract

Multiple dependent state sampling plan operating characteristic curve process capability index process yield
Acceptance sampling plans have been one of practical tools for quality control applications, and several acceptance sampling plans were developed for different purposes. In particular, the concept of multiple dependent state (MDS) sampling plan was developed, in which the lot disposition is not only based on the current sample from the lot, but also on sample results from past lots. This paper attempts to develop a variables MDS sampling plan for normally distributed processes with two-sided specification limits. The performance of the proposed plan is examined and compared with the existing variables single sampling plan. © 2014 IEEE.

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