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A new robust paradigm for diagnosing hold-time faults in scan chains
Conference paper

A new robust paradigm for diagnosing hold-time faults in scan chains

Edward Hsu, Shi-Yu Huang and Chao-Wen Tzeng
2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006 - Proceedings of Technical Papers, pp.171-174
2007

Abstract

Hold-time violation is a common cause of failure at scan chains. A robust new paradigm for diagnosing such failure is presented in this papist. As compared to previous methods, the major advantage of ours is the ability to tolerate non-ideal conditions, e.g., under the presence of certain core logic faults or for those faults that manifest themselves intermittently. We first formulate the diagnosis problem as a delay Insertion process. Then, two algorithms including a greedy algorithm and a so-called best-alignment based algorithm will be proposed. Experimental results on a number of real designs are presented to demonstrate its effectiveness. © 2006 IEEE.

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