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A new switching model for sampling plan based on process yield
Conference paper

A new switching model for sampling plan based on process yield

Shih-Wen Liu and Chien-Wei Wu
2020 Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling, APARM 2020, 9209579
08/2020

Abstract

OC curve process capability indices process yield sampling inspection switching rules Energy Engineering and Power Technology Mechanical Engineering Safety Risk Reliability and Quality Modeling and Simulation
This paper proposes a new sampling strategy by considering the concept of resampling with switching rule based on the process yield index. The proposed plan is designed involving a flexible critical region and two inspection policies for deciding on the submitted lot. The computation result shows that such design can lessen the average sample number (ASN) for inspection under the same quality requirements and tolerable risks. Besides, the proposed method provides a better shape of operating characteristic (OC) curve which guarantees better performance on its discriminatory power. The plan parameters of the proposed method with selected conditions are provided as well for quick reference.

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