Abstract
This study presents a novel double-side CMOS post-process to monolithically integrate various capacitance type CMOS sensors on a single chip. In applications, the pressure sensor and linear accelerometer have been realized and monolithic integrated using the TSMC 2P4M process and the present post-process. The measurement results show that sensitivities (non-linearity) of the pressure sensor and the accelerometer are 12mV/kPa (4.77%), and 3.9mV/G (1.06%), respectively. The measurement ranges are 0-10kPa, and 0.3-6G, respectively. ©2008 IEEE.