- Title
- A patent quality analysis methodology for innovation management
- Creators - without role
- A.J.C. Trappey - 國立清華大學工學院工業工程與工程管理學系C.V. TrappeyC.-Y. WuChi-Wei Lin
- Identifiers
- 9957773822506774
- Academic Unit
- Department of Industrial Engineering and Engineering Management, College of Engineering, National Tsing Hua University
- Language
- English
- Resource Type
- Conference paper
- Publication Details
- International Conference on Mass Customization and Personalization - Asia Pacific 2010 (MCP-AP2010) International Conference on Mass Customization and Personalization - Asia Pacific 2010 (MCP-AP2010)
Conference paper
A patent quality analysis methodology for innovation management
International Conference on Mass Customization and Personalization - Asia Pacific 2010 (MCP-AP2010) International Conference on Mass Customization and Personalization - Asia Pacific 2010 (MCP-AP2010)
2010
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