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A prototype of a wireless-based test system
Conference paper

A prototype of a wireless-based test system

Jing-Jia Liou, Chih-Tsun Huang, Cheng-Wen Wu, Ching-Cheng Tien, Chih-Hu Wang, Hsi-Pin Ma, Ying-Yen Chen, Yueh-Chih Hsu, Li-Ming Deng, Chien-Jung Chiu, …
Proceedings - 20th Anniversary IEEE International SOC Conference, pp.225-228
2007

Abstract

Electrical and Electronic Engineering
In this paper, we will describe a prototyping system to demonstrate a next-generation test configuration, which uniformly supports wafer test, final production test and field diagnosis. The implementation shows that we can reduce the test cost significantly by adapting a wireless-based test system. ©2007 IEEE.

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