A test access control and test integration system for system-on-chip

Conference paper

C.-W. Wang, J.-R. Huang, K.-L. Cheng, H.-S. Hsu, C.-T. Huang, C.-W. Wu and Y.-L. Lin

6th IEEE Int. Workshop on Testing Embedded Core-Based System-Chips (TECS), pp.2.1-2.8

05/2002

Abstract

SOC

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Title: A test access control and test integration system for system-on-chip
Creators - without role: C.-W. Wang
J.-R. Huang
K.-L. Cheng
H.-S. Hsu
C.-T. Huang
C.-W. Wu
Y.-L. Lin
Publication Details: 6th IEEE Int. Workshop on Testing Embedded Core-Based System-Chips (TECS), pp.2.1-2.8
Identifiers: 9957777402406774
Academic Unit: College of Electrical Engineering and Computer Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper