A test controller for system-on-chip designs with test wrappers

Conference paper

J.-B. Chen, J.-F. Li, H.-J. Huang, C.-P. Su, C.-W. Wu, C. Cheng, S.-I Chen, C.-Y. Hwang and H.-P. Lin

Proc. 12th VLSI Design/CAD Symp.

08/2001

Abstract

test controller;system-on-chip;wrappers

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Title: A test controller for system-on-chip designs with test wrappers
Creators - without role: J.-B. Chen
J.-F. Li
H.-J. Huang
C.-P. Su
C.-W. Wu
C. Cheng
S.-I Chen
C.-Y. Hwang
H.-P. Lin
Identifiers: 9957777716406774
Academic Unit: College of Electrical Engineering and Computer Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper
Publication Details: Proc. 12th VLSI Design/CAD Symp.