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A time delay multiple integration linear CMOS image sensor for multispectral satellite telemetry
Conference paper

A time delay multiple integration linear CMOS image sensor for multispectral satellite telemetry

Kuan-Lin Liu, Chih-Cheng Hsieh, Sheng-Yeh Lai and Chin-Fong Chiu
2016 IEEE Asian Solid-State Circuits Conference, A-SSCC 2016 - Proceedings, pp.37-40
02/2017

Abstract

capacitive trans-impedance amplifier (CTIA) line-scan imaging sensor multiple sampling (MS) multispectral (XS) time-delay integration (TDI) Electrical and Electronic Engineering Hardware and Architecture
This paper presents a time delay multiple integration (TDMI) linear CMOS image sensor for multispectral satellite telemetry. With the proposed hybrid structure of analog and digital accumulation, the implemented time delay multiple integrator integrates the functions of TDI, multiple sampling (MS), and analog-to-digital conversion in a single chip. An 8 × 128 linear CMOS image sensor prototype was fabricated in 0.18-μm 1P6M 1.8 V CMOS technology. With an operation of ×8 TDI, ×64 MS, and a line time of 414.72 μs, the measured sensitivity, SNR improvement, and power consumption are 40.42 V/lux-s, 9.37 dB, and 17.77 mW, respectively.

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