- Title
- A transmission electron energy loss spectrometry study for the source of an anomalous positive exchange bias in a Ni80Fe20/Ni xFe1-xO thin-film bilayer
- Creators - without role
- H. Ouyang - National Chung Hsing UniversityK. Lin - National Chung Hsing UniversityC. Liu - National Chung Hsing UniversityY. Tzeng - National Chung Hsing UniversityZ. Guo - National Chung Hsing UniversityJ. Van Lierop - University of Manitoba
- Identifiers
- 1424414792; 9781424414796; 9957776131106774
- Academic Unit
- Department of Materials Science and Engineering, College of Engineering, National Tsing Hua University
- Language
- English
- Resource Type
- Conference paper
- Publication Details
- INTERMAG 2006 - IEEE International Magnetics Conference, p.182
Conference paper
A transmission electron energy loss spectrometry study for the source of an anomalous positive exchange bias in a Ni80Fe20/Ni xFe1-xO thin-film bilayer
INTERMAG 2006 - IEEE International Magnetics Conference, p.182
2006
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