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A unified aging model with recovery effect and its impact on circuit design
Conference paper

A unified aging model with recovery effect and its impact on circuit design

Wai-Kit Lee, Kasa Huang, Li Chung Hsu, Clement Huang, Jim Liang, Julian Chen, Cheng Hsiao, Ke-Wei Su, Chung-Kai Lin and Min-Chie Jeng
International Conference on Simulation of Semiconductor Processes and Devices, SISPAD, Vol.2017-September, pp.93-96
10/2017

Abstract

Aging Model Recovery Effect TMI Electrical and Electronic Engineering Computer Science Applications Modeling and Simulation
In this paper we not only discuss how to implement the recovery effect with TMI but also give various examples to show that without considering the recovery effect, the design margin of a system can be either under-or over-estimated. To validate our modeling methodology, the simulation results are benchmarked with measurement data.

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