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Adhesion measurement of micropatterned surfaces using three-dimensional-printed atomic force microscopy tips
Conference paper   Peer reviewed

Adhesion measurement of micropatterned surfaces using three-dimensional-printed atomic force microscopy tips

Chih-Yi Hung, Yun-Peng Yeh, Cheng-Kuo Sung, Wei-Chien Liao, Tzu-Han Chuang and Chien-Chung Fu
Japanese Journal of Applied Physics, Vol.56(6), 06GK04
06/2017

Abstract

Engineering (all) Physics and Astronomy (all)
The aim of the present work is to fabricate three-dimensional-printed (3D-printed) atomic force microscopy (AFM) tips for the measurement of the adhesion force on micropatterned surfaces. The shape of the microstructure strongly affects the peeling-off process in the fabrication of flexible electronic devices, and we demonstrate the fabrication of a micropatterned structure for the peeling-off process from soft materials. Furthermore, the 3D-printed AFM tips not only have an optimized design but also increase the sensitivity of adhesion force measurement. We have demonstrated the conical 3D-printed AFM tips with the radii of the spherical end from 2 to 10 μm with various sensitivities of adhesive force measurement.

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