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An experimental investigation on the Q-boosted CMOS-MEMS flexural-mode resonator circuits
Conference paper

An experimental investigation on the Q-boosted CMOS-MEMS flexural-mode resonator circuits

Ming-Huang Li, Chao-Yu Chen and Sheng-Shian Li
IFCS 2014 - 2014 IEEE International Frequency Control Symposium, Proceedings, 6859931
2014

Abstract

Biasing conditions;Experimental investigations;Monolithically integrated;Motional impedance;Nonlinearity models;On-chip amplifiers;Phase noise performance;Through transmission Control and Systems Engineering
This work reports an extraordinary Q-boosting effect in a monolithically integrated CMOS-MEMS flexural-mode resonator circuit. The proposed resonator circuit centered at 960 kHz with a maximum Q of 12,673 is demonstrated for the first time among CMOS-MEMS flexural-mode based resonators (their typical Q ~ 1,500). Under proper biasing conditions while interfaced with on-chip amplifier circuits, the maximum Q of the resonator circuit can be magnified at least 5X as the dc bias voltage (V P ) beyond certain threshold level. Such a Q-booting effect cannot be explained by a traditional drive level-dependent Duffing nonlinearity model [1], and the mechanism behind this phenomenon is still under investigation. With this Q-boosting feature, oscillators implementing these CMOS-MEMS resonator circuits are expected to greatly improve both close-to-carrier (through high Q) and far-from-carrier (through transmission enhancement, i.e., low motional impedance) phase noise performance even using flexure-mode type MEMS resonators. © 2014 IEEE.

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