- Title
- An improved VLSI test economics analysis system
- Creators - without role
- J.-D. LinJ.-M. LuC.-W. Wu
- Publication Details
- Proc. 9th VLSI Design/CAD Symp., pp.149-152
- Identifiers
- 9957770737406774
- Academic Unit
- College of Electrical Engineering and Computer Science, National Tsing Hua University
- Language
- Traditional Chinese
- Resource Type
- Conference paper
Conference paper
An improved VLSI test economics analysis system
Proc. 9th VLSI Design/CAD Symp., pp.149-152
08/1998
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