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Application of atomic force microscopy nanomachining to the fabrication of metallic nanodots, nanowires, and nanoelectrodes
Conference paper

Application of atomic force microscopy nanomachining to the fabrication of metallic nanodots, nanowires, and nanoelectrodes

Ju-Hung Hsu, Chun-Yu Lin, Yu-Ju Chen and Heh-Nan Lin
材料科學年會論文集 材料科學年會論文集
2004

Abstract

We report a simple method to fabricate metallic nanostructures by a combination of atomic force microscopy (AFM) nanomachining and subsequent lift-off process. By controlling the force of an AFM tip on a thin PMMA resist, nanoscale holes and grooves are first created. By coating a metal film and performing the lift-off process, metallic nanodots with a size of 70 nm and nanowires with a width of 75 nm are successfully fabricated. In addition, nanoelectrodes with a gap of around 50 nm are also produced by cutting a nanowire with the tip. The present method demonstrates the feasibility and effectiveness of using single-layer resist in AFM mechanical lithography instead of two-layer resist reported in the literature.

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