Apply TRIZ and AHP to improve Cell Test yield and Reduce Inventory

Conference paper

Tsai M-Y. and Chiu M-C.

2016 Conference of Systematic Innovation 2016 Conference of Systematic Innovation

2016

Abstract

Habitual domain;fuzzy competence sets;max-product relation constraints;modelling

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Title: Apply TRIZ and AHP to improve Cell Test yield and Reduce Inventory
Creators - without role: Tsai M-Y.
Chiu M-C. - 國立清華大學工學院工業工程與工程管理學系
Identifiers: 9957773628606774
Academic Unit: Department of Industrial Engineering and Engineering Management, College of Engineering, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper
Publication Details: 2016 Conference of Systematic Innovation 2016 Conference of Systematic Innovation