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Assembly Reliability Improvement of 3D-ICs Packaging Using Pre-Stuffed Molding Material
Conference paper

Assembly Reliability Improvement of 3D-ICs Packaging Using Pre-Stuffed Molding Material

C. C. Lee, Y. H. Guo, Y. M. Lin, C. J. Zhan and T. C. Chang
3rd International Symposium on Next-Generation Electronics (ISNE 2014) 3rd International Symposium on Next-Generation Electronics (ISNE 2014)
2014

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