Logo image
Automatic generation of Boundary Scan and BIST circuitry
Conference paper

Automatic generation of Boundary Scan and BIST circuitry

F.-D. Guo, J.-H. Hong and C.-W. Wu
Proc. 5th VLSI Design/CAD Symp., pp.251-256
1994

Abstract

BIST;circuitry

Metrics

1 Record Views

Details

Logo image