Logo image
BIST and diagnosis of fully logic blocks in FPGAs
Conference paper

BIST and diagnosis of fully logic blocks in FPGAs

S.-K. Lu, J.-S. Shih and C.-W. Wu
Proc. 11th VLSI Design/CAD Symp., pp.413-416
08/2000

Abstract

BIST;fully logic blocks;FPGA

Metrics

1 Record Views

Details

Logo image