Built-in self-forming, built-in self-test, and built-in self-repair for RRAM yield improvement

Conference paper

C.-Y. Chen, H.-C. Shih, M. Lee, C.-W. Wu, C.-H. Lin and S.-S. Sheu

VLSI Test Tech. Workshop (VTTW)

2011

Abstract

Built-in;self-forming;self-test;RRAM

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Title: Built-in self-forming, built-in self-test, and built-in self-repair for RRAM yield improvement
Creators - without role: C.-Y. Chen
H.-C. Shih
M. Lee
C.-W. Wu - 國立清華大學電機資訊學院電機工程學系
C.-H. Lin
S.-S. Sheu
Publication Details: VLSI Test Tech. Workshop (VTTW)
Identifiers: 9957766563306774
Academic Unit: College of Electrical Engineering and Computer Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper