Built-in self-test of iterative logic arrays

Conference paper

Built-in self-test of iterative logic arrays

C.-W. Wu, S.-K. Lu and J.-C. Wang

Proc. Int. Electron Devices and Material Symp. (EDMS), pp.485-488

1990

Abstract

Built-in;self-test;iterative logic arrays

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Title: Built-in self-test of iterative logic arrays
Creators - without role: C.-W. Wu - 國立清華大學電機資訊學院電機工程學系
S.-K. Lu
J.-C. Wang
Identifiers: 9957771110406774
Academic Unit: College of Electrical Engineering and Computer Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper
Publication Details: Proc. Int. Electron Devices and Material Symp. (EDMS), pp.485-488