Built-in self-test techniques using Boundary Scan Standard circuitry

Conference paper

Built-in self-test techniques using Boundary Scan Standard circuitry

C.-H. Tsai, J.-H. Hong and C.-W. Wu

Proc. 5th VLSI Design/CAD Symp., pp.257-262

1994

Abstract

Built-in;self-test;circuitry

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Title: Built-in self-test techniques using Boundary Scan Standard circuitry
Creators - without role: C.-H. Tsai
J.-H. Hong
C.-W. Wu - 國立清華大學電機資訊學院電機工程學系
Publication Details: Proc. 5th VLSI Design/CAD Symp., pp.257-262
Identifiers: 9957769746606774
Academic Unit: College of Electrical Engineering and Computer Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper