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Charge sharing fault analysis and testing for CMOS domino logic circuits
Conference paper

Charge sharing fault analysis and testing for CMOS domino logic circuits

Ching-Hwa Cheng, Wen-Ben Jone, Jinn-Shyan Wang and Shih-Chieh Chang
Proceedings of the Asian Test Symposium, pp.435-440
2000

Abstract

Because domino logic design offers smaller area and faster delay than conventional CMOS design, it is very popular in the high-performance processor design. However, domino logic suffers from several design problems and one of the most notable ones is the charge-sharing problem. In this paper, we describe a method to measure the sensitivity of the charge-sharing problem for each domino gate. In addition, our algorithm also generates test vectors to detect the worst case of charge-sharing fault.

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