Chip-Level High-Frequency EMC Strategies and Measurement Techniques

Yin-Cheng Chang; Ping-Yi Wang; Ta-Yeh Lin; Chao-Ping Hsieh; Da-Chiang Chang; Shawn S. H. Hsu

doi:10.1109/RFIT54256.2022.9882454

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Conference paper

Chip-Level High-Frequency EMC Strategies and Measurement Techniques

Yin-Cheng Chang, Ping-Yi Wang, Ta-Yeh Lin, Chao-Ping Hsieh, Da-Chiang Chang and Shawn S. H. Hsu

RFIT 2022 - 2022 IEEE International Symposium on Radio-Frequency Integration Technology, pp.137-139

2022

DOI: https://doi.org/10.1109/RFIT54256.2022.9882454

Abstract

electromagnetic interference (EMI)

electromagnetic susceptibility (EMS)

IC-electromagnetic compatibility (IC-EMC)

measurement

on-chip

Computer Networks and Communications

Hardware and Architecture

Signal Processing

Electrical and Electronic Engineering

Instrumentation

This paper presents different electromagnetic compatibility (EMC) strategies for achieving low EM emission and high immunity. The proposed designs and measurement techniques for improving and evaluating the chip level EM interference (EMI) and EM susceptibility (EMS) are included to provide high-frequency EMC solutions. This paper also gives a comprehensive overview for the researchers to continue working on the EMC-related topics and issues at the chip level at high frequencies.

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Title: Chip-Level High-Frequency EMC Strategies and Measurement Techniques
Translated title: Chip-Level High-Frequency EMC Strategies and Measurement Techniques
Creators - without role: Yin-Cheng Chang - National Tsing Hua University , Institute of Electronics Engineering
Ping-Yi Wang - National Tsing Hua University , Institute of Electronics Engineering
Ta-Yeh Lin - Taiwan Semiconductor Research Institute , National Applied Research Laboratories
Chao-Ping Hsieh - Taiwan Semiconductor Manufacturing Company (Taiwan)
Da-Chiang Chang - Taiwan Semiconductor Research Institute , National Applied Research Laboratories
Shawn S. H. Hsu - National Tsing Hua University
Identifiers: 9781665466493; 9957774413206774
Academic Unit: College of Electrical Engineering and Computer Science, National Tsing Hua University
Language: English
Resource Type: Conference paper
Publication Details: RFIT 2022 - 2022 IEEE International Symposium on Radio-Frequency Integration Technology, pp.137-139

Chip-Level High-Frequency EMC Strategies and Measurement Techniques

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