Computational Assessment of Single Event Upset Rates for 55 SRAMs Assumed on Board the Aircraft Flying from Taipei to Various Destinations

Conference paper

Zi-Yi Yang, Yen-Ting Wen and Rong-Jiun Sheu

Transactions of the American Nuclear Society, Vol.125(1), pp.1093-1096

2021

Abstract

Nuclear Energy and Engineering

Safety

Risk

Reliability and Quality

1 Record Views

Title: Computational Assessment of Single Event Upset Rates for 55 SRAMs Assumed on Board the Aircraft Flying from Taipei to Various Destinations
Translated title: Computational Assessment of Single Event Upset Rates for 55 SRAMs Assumed on Board the Aircraft Flying from Taipei to Various Destinations
Creators - without role: Zi-Yi Yang - Institute of Nuclear Energy Research
Yen-Ting Wen - Institute of Nuclear Engineering and Science , National Tsing Hua University
Rong-Jiun Sheu - Institute of Nuclear Engineering and Science , National Tsing Hua University
Identifiers: 9957770124006774
Academic Unit: Institute of Nuclear Engineering and Science, College of Nuclear Science, National Tsing Hua University
Language: English
Resource Type: Conference paper
Publication Details: Transactions of the American Nuclear Society, Vol.125(1), pp.1093-1096