Data Value Development to Enhance Yield & Maintain Competitive Advantage for Semiconductor Manufacturing

Conference paper

INFORMS Annual Meeting INFORMS Annual Meeting

2002

Metrics

1 Record Views

Title: Data Value Development to Enhance Yield & Maintain Competitive Advantage for Semiconductor Manufacturing
Creators - without role: C. Peng
Chen-Fu Chien - 國立清華大學工學院工業工程與工程管理學系
Identifiers: 9957776176706774
Academic Unit: Department of Industrial Engineering and Engineering Management, College of Engineering, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper
Publication Details: INFORMS Annual Meeting INFORMS Annual Meeting