Descriptive process attribute sequence to sequence rolling for zero-shot fault diagnosis

會議論文

Descriptive process attribute sequence to sequence rolling for zero-shot fault diagnosis

Wen-An Lee, 遠姚和 Jia-Lin Kang

Foundations of Process/Product Analytics and Machine learning 2023 (FOPAM 2023)

University of California, Davis, California, USA, 30/07/2023–03/08/2023

07/2023

摘要

zero-shot fault diagnosis

相關連結

指標

1 檢視次數

詳細資料

題名: Descriptive process attribute sequence to sequence rolling for zero-shot fault diagnosis
創作者：: Wen-An Lee (作者)
遠姚 (作者)
Jia-Lin Kang (作者)
會議: University of California, Davis, California, USA, 30/07/2023–03/08/2023
學術資源類型: 會議論文
出版日期: 07/2023
出版資訊: Foundations of Process/Product Analytics and Machine learning 2023 (FOPAM 2023)
語言: 英語