Design and Test of 3D and Emerging Memories

Conference paper

Design and Test of 3D and Emerging Memories

C.-W. Wu, D. Dunning, F. Chen and H.-H. Lee

Proc. 28th IEEE VLSI Test Symp. (VTS)

05/2011

Abstract

3D;emerging memory

electrical engineering

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Title: Design and Test of 3D and Emerging Memories
Creators - without role: C.-W. Wu
D. Dunning
F. Chen
H.-H. Lee
Publication Details: Proc. 28th IEEE VLSI Test Symp. (VTS)
Identifiers: 9957771762106774
Academic Unit: College of Electrical Engineering and Computer Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper