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Design of efficient totally self-checking checkers for m-out-of-n code
Conference paper

Design of efficient totally self-checking checkers for m-out-of-n code

W.-F. Chang and C.-W. Wu
Proceedings of the Asian Test Symposium, pp.281-286
1993

Abstract

Electrical and Electronic Engineering
This paper presents a new design method of efficient totally self-checking (TSC) checkers for m-out-of-n code. The design procedure has three steps. First, we append an appropriate number of 1's to the m/n code to get a k/2k code, and design a TSC checker for this k/2k code which can be easily constructed by the conventional method. Then, we delete the appended 1's and simplify the circuit to get an m/n code checker. Finally, we modify the checker using super gates to meet the self-testing conditions ad get a final TSC m/n code checker. Compared with previous methods, our TSC checker requires significantly less hardware.

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