Determining the Optimal Wafer Start Rate in Semiconductor Manufacturing during New Technology Ramp-up

Conference paper

Liam Y. Hsieh and Kuo-Hao Chang

APIEMS APIEMS

2014

Abstract

Quality in Healthcare;Lean six sigma (LSS);acute myocardial infarction;door-to-balloon time;process improvement

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Title: Determining the Optimal Wafer Start Rate in Semiconductor Manufacturing during New Technology Ramp-up
Creators - without role: Liam Y. Hsieh
Kuo-Hao Chang - 國立清華大學工學院工業工程與工程管理學系
Identifiers: 9957776969006774
Academic Unit: Department of Industrial Engineering and Engineering Management, College of Engineering, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper
Publication Details: APIEMS APIEMS