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Developing statistical models in an Early Warning System and its empirical study
Conference paper

Developing statistical models in an Early Warning System and its empirical study

Pei-Nong Chen, Chen-Fu Chien, Sheng-Jen Wang, Chien-Chung Chen and Haw-Jyue Luo
2004 Semiconductor Manufacturing Technology Workshop Proceedings, SMTW, pp.174-177
2004

Abstract

When a new equipment or process is released, it is critical to ensure it behave as expected and stay in normal condition. The study proposes a research framework in which a statistical model is constructed for newly released equipment and process monitoring. An empirical study is conducted in a DRAM fabrication facility for validation. Based on the model, a best set of sample test items which discriminates the newly released equipment is selected and a group of normal equipments is obtained. Thus, the alarm signals can be triggered in an Early Warning System. © 2004IEEE.

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