Diagnosing Abnormal WAT Problems by Applying an Effective Data Mining Framework

Conference paper

3rd Modeling and Analysis of Semiconductor Manufacturing Conference 3rd Modeling and Analysis of Semiconductor Manufacturing Conference, pp.365-372

2005

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Title: Diagnosing Abnormal WAT Problems by Applying an Effective Data Mining Framework
Creators - without role: S. Hsu
Chen-Fu Chien - 國立清華大學工學院工業工程與工程管理學系
Publication Details: 3rd Modeling and Analysis of Semiconductor Manufacturing Conference 3rd Modeling and Analysis of Semiconductor Manufacturing Conference, pp.365-372
Identifiers: 9957768268106774
Academic Unit: Department of Industrial Engineering and Engineering Management, College of Engineering, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper