Direct observation of a 2DEG within the channel of a MODFET and of interface quality in InP/InGaAs RTDs with STM

Conference paper

S. L. Skala, W. Wu, J. R. Tucker, K. Y. Cheng and J. W. Lyding

14th North American Conference on Molecular Beam Epitaxy

1994

Abstract

2DEG;MODFET;InP/InGaAs;RTDs;STM

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Title: Direct observation of a 2DEG within the channel of a MODFET and of interface quality in InP/InGaAs RTDs with STM
Creators - without role: S. L. Skala
W. Wu
J. R. Tucker
K. Y. Cheng
J. W. Lyding
Publication Details: 14th North American Conference on Molecular Beam Epitaxy
Identifiers: 9.78156E+12; 9957774949206774
Academic Unit: National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper