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Discrete 1Ω Probe by Using Flip-Chip IPD Resistor and Amplifier for Inspecting EMI of a Packaged IC
Conference paper

Discrete 1Ω Probe by Using Flip-Chip IPD Resistor and Amplifier for Inspecting EMI of a Packaged IC

Yin-Cheng Chang, Ta-Yeh Lin, Chaoping Hsieh, Da-Chiang Chang, Shawn S. H. Hsu, Mao-Hsu Yen and Jian-Li Dong
2019 IEEE CPMT Symposium Japan, ICSJ 2019, pp.163-164
11/2019
DOI: https://doi.org/10.1109/ICSJ47124.2019.8998742

Abstract

Active current probe CMOS Conducted emission Electromagnetic emission (EME) IC Hardware and Architecture Electronic Optical and Magnetic Materials Electrical and Electronic Engineering Industrial and Manufacturing Engineering
A 1Ω probe for EMI test is implemented by using a flip-chip integrated passive device (IPD) resistor and a commercial amplifier. Comparing with the conventional 1Ω probe composed of only the passive resistors (a 1-Ω plus a 49-Ω resistor), the proposed 1Ω probe exhibits better gain and noise performance. With the improved sensitivity, it could be helpful for detecting the suspicious EMI of a packaged IC.

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