- Title
- Economic analysis of built-in self-test for logic and memory cores
- Creators - without role
- J.-M. LuC.-W. Wu
- Publication Details
- Proc. 10th VLSI Design/CAD Symp., pp.203-206
- Identifiers
- 9957775067506774
- Academic Unit
- College of Electrical Engineering and Computer Science, National Tsing Hua University
- Language
- Traditional Chinese
- Resource Type
- Conference paper
Conference paper
Economic analysis of built-in self-test for logic and memory cores
Proc. 10th VLSI Design/CAD Symp., pp.203-206
08/1999
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