Effects of Different Tunnel Layers on Retention Characteristics for Pd-nanocrystal-based Nonvolatile Memory

Conference paper

T. K. Kang, Y. F. Chen, C. Y. Fu, Z. K. Wang, T. Y. Yang, S. Y. Yang and W. F. Wu

2011

Abstract

Pd nanocrystal;HfAlO;Thermal stress;Retention characteristic;Thermal expansion

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Title: Effects of Different Tunnel Layers on Retention Characteristics for Pd-nanocrystal-based Nonvolatile Memory
Creators - without role: T. K. Kang
Y. F. Chen
C. Y. Fu
Z. K. Wang
T. Y. Yang
S. Y. Yang
W. F. Wu - 國立清華大學原子科學院工程與系統科學系
Identifiers: 9957772314606774
Academic Unit: Department of Engineering and System Science, College of Nuclear Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper