Effects of Edge Thinning on Fowler-Nordheim Tunneling Current of NAND-Type Flash Memory Cells

Conference paper

J. T. Liang, C. H. Shih, Y. X. Luo, M. K. Huang, N. D. Chien, R. K. Shia, S. M. Wu, C. Lien and W. F. Wu

2011

Abstract

Edge Thinning;Fowler-Nordheim Tunneling Current;NAND-Type Flash Memory Cells

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Title: Effects of Edge Thinning on Fowler-Nordheim Tunneling Current of NAND-Type Flash Memory Cells
Creators - without role: J. T. Liang
C. H. Shih
Y. X. Luo
M. K. Huang
N. D. Chien
R. K. Shia
S. M. Wu
C. Lien
W. F. Wu - 國立清華大學原子科學院工程與系統科學系
Identifiers: 9957772087706774
Academic Unit: Department of Engineering and System Science, College of Nuclear Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper